Book Chapters

"Design And Test Of Digital Circuits By Quantum-dot Cellular Automata", F. Lombardi and J. Huang
(editors), Chapters 1-5, 7 and 8, Artech House Inc., Norwood, MA, 2007, ISBN:1596932678.

List of Archival Journal Publications

J2. M. Momenzadeh, J. Huang, F. Lombardi, "Design of Sequential Circuits by Quantum-dot Cellular Automata", Microelectronics Journal, vol. 38, issue 4-5, pp. 525-537, 2007.

J3. J. Huang, M. Momenzadeh, F. Lombardi, "On the Tolerance to Manufacturing Defects in Molecular QCATiles for Processing-by-wire", Journal of Electronic Testing: Theory and Applications (JETTA), vol. 23, no. 2-3, pp.
163-174, 2007.

J4. J. Huang, M. Momenzadeh, F. Lombardi, "Analysis of Missing and Additional Cell Defects in Sequential
Quantum-Dot Cellular Automata", Integration the VLSI Journal, vol. 40, issue 4, pp. 503-515, 2007.

J5. M. Momenzadeh, J. Huang, L. Schiano, M. Ottavi, F. Lombardi, "Tile-Based QCA Design Using Majority-Like Logic Primitives", ACM Journal on Emerging Technologies in Computing Systems, vol. 1, no. 3, pp.163-185, 2006.

J6. L. Schiano, M. Momenzadeh, F. Zhang, Y. J. Lee, T. Kane, S. Max, P. Perkins, Y-B. Kim, F. Lombardi, F. J. Meyer, "Measuring the Timing Jitter of ATE in the Frequency Domain", IEEE Transactions on Instrumentation and
Measurement, vol. 55, issue 1, pp. 280-289, 2006.

J7. M. Momenzadeh, J. Huang, M.B. Tahoori, F. Lombardi, "On the Evaluation of Scaling of QCA Devices in the Presence of Defects at Manufacturing", IEEE Transactions on Nanotechnology, vol. 4, issue 6, pp. 740 – 743, 2005.

J8. M. Momenzadeh, J. Huang, M.B. Tahoori, F. Lombardi, "Characterization, Test and Logic Synthesis of And-Or-Inv (AOI) Gate Design for QCA Implementation", IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), vol. 24, issue 12, pp. 1881-1893, 2005.

J9. M.B. Tahoori, M. Momenzadeh, J. Huang, F. Lombardi, "Testing of Quantum Cellular Automata", IEEE Transactions on Nanotechnology, vol. 3, issue 4, pp. 432-442, 2004.

List of Articles in Refereed Conference Proceedings

C1. J. Huang, M. Momenzadeh, F. Lombardi, "An Overview of Devices and Circuits at Nano Scale", IEEE Design & Test of Computers Magazine, vol. 24, no. 4, pp. 304-311, 2007.

C2. M. Momenzadeh, J. Huang, F. Lombardi, "Defect Tolerance of QCA Tiles", IEEE Design, Automation and Test in Europe Conference (DATE), vol. 1, pp. 1-6, 2006.

C3. M. Momenzadeh, M. Ottavi, F. Lombardi "Modeling QCA Defects at Molecular-level in Combinational Circuits", IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT), pp. 208-216, 2005.

C4. M. Momenzadeh, J. Huang, F. Lombardi, "Defect Characterization and Tolerance of QCA Sequential Devices and Circuits", IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT), pp. 199-207,
2005.

C5. J. Huang, M. Momenzadeh, L. Schiano, F. Lombardi, "Simulation-based Design of Modular QCA Circuits", IEEE Conference on Nanotechnology, Paper WE-P7-1, IEEE CD-ROM 05TH8816C, 2005.

C6. J. Huang, M. Momenzadeh, M.B. Tahoori, F. Lombardi, "Design and Characterization of an And-Or-Inverter (AOI) Gate for QCA Implementation", ACM Great Lakes Symposium on VLSI, pp. 426-429, 2004.

C7. M. Momenzadeh, M.B. Tahoori, J. Huang, F. Lombardi, "Quantum Cellular Automata: New Defects and Faults for New Devices", International Parallel and Distributed Processing Symposium (IPDPS), pp. 207-214, 2004.

C8. L. Schiano, M. Momenzadeh, F. Zhang, Y. Lee, Y-B; Kim, F. Lombardi, F.J. Meyer, T. Kane, S. Max, P. Perkins, "Frequency domain measurement of timing jitter in ATE", IEEE Instrumentation and Measurement Technology Conference, vol.3, pp. 2150-2155, 2004.

C9. M.B. Tahoori, M. Momenzadeh, J. Huang, F. Lombardi, "Defects and Fault Characterization in Quantum Cellular Automata", Nanotechnology Conference, vol. 3, pp.190-193, 2004.

C10. J. Huang, M. Momenzadeh, M.B. Tahoori, F. Lombardi, "Defect Characterization for Scaling of QCA Devices", IEEE Symposium on Defect and Fault Tolerance in VLSI Systems (DFT), pp. 30-38, 2004.

C11. M.B. Tahoori, M. Momenzadeh, J. Huang, F. Lombardi, "Defects and Faults in Quantum Cellular Automata at Nano Scale", IEEE VLSI Test Symposium (VTS), pp. 291-296, 2004.

C12. F. Zhang, Y.J. Lee, T. Kane, L. Schiano, M. Momenzadeh, Y.B. Kim, F. J. Meyer, F. Lombardi, S. Max, P. Perkinson, "A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment", IEEE
Symposium on Defect and Fault Tolerance in VLSI Systems (DFT), pp. 159-166, 2003.

C13. D.R. Kowalski, M. Momenzadeh, A.A. Shvartsman, "Emulating Shared-Memory Do-All Algorithms in Asynchronous Message-Passing Systems", International Conference On Principles of Distributed Systems, Springer -LNCS series, pp. 210-222, 2003.